Automated Testing Equipment

Our ATE products ensure high value, complex, electronic and electro-optical weapon systems are mission ready and evaluate defense electronic performance in complex environments.

Highlight: AN/TSM-217 Next Generation Automatic Test System (NGATS)

NGATS reduces the fielded footprint and increases capability while maintaining the ability to support the current force using existing test program sets.

AN/GSM-397(V) Electronic System Test Set (ESTS)

ESTS is a technically advanced, open architecture test system built to provide intermediate test capability for the USAF F-15.

AN/TSM-191(V)5 Electronics Shop, Transportable (EOTF)

Northrop Grumman’s AN/TSM-191(V)5 Electronics Shop, Transportable, commonly known as the Electro-Optics Test Facility (EOTF), tests an extensive range of Army electro-optics (EO) systems.

AN/USM-632(V)3 Base Shop Test Facility (BSTF)

BSTF is a compact, modular, high performance automatic test set that is easily tailored to a full range of applications.

AN/USM-632(V)4 Electro-Optic Test Station (EOTS)

EOTS tests an extensive range of Army electro-optic systems. EOTS is part of IFTE, and tests and fault isolates electro-optical and electronic LRUs in a full range of weapon systems.

Base Shop Test Facility (V)6

BSTF is a compact, modular, high performance automatic test set that is easily tailored to a full range of applications.

Combined Intermediate-Level ATE (CIATE)

Northrop Grumman's Combined Intermediate-Level Automatic Test Equipment (CIATE) provides a comprehensive line replaceable unit (LRU) and shop replaceable unit (SRU) test capability for factory, depot and intermediate-level support.

Commercial Equivalent Equipment (CEE)

All TPSs developed on the CEE are fully transportable to the militarized, field-deployable BSTF.

Electro-Optical Module (EOM)

The EOM electro-optical test device provides highly automated, accurate, reliable and repeatable test results.

Electro-Optical Subsystem (EOSS+)

EOSS+ is a consolidated, integrated EO automatic test system.

Integrated Family of Test Equipment (IFTE)

IFTE is a series of test systems used off-system for testing electronic and electro-optic weapons devices, including missile systems, vehicles, aircraft and more.

AN/TSM-217 Next Generation Automatic Test System (NGATS)

NGATS reduces the fielded footprint and increases capability while maintaining the ability to support the current force using existing test program sets.

Virtual System Analyzer (VSA)

The VSA performs precision RF/microwave testing of complex EW systems in a small footprint – one "C" size, 13 slot, standard VXI cage.