Automated Testing Equipment

 

Our ATE products ensure high value, complex, electronic and electro-optical weapon systems are mission ready and evaluate defense electronic performance in complex environments.

 

ARGCSHighlight: Agile Rapid Global Combat Support (ARGCS)

Fully integrates diagnostics, directed test, net-centric capabilities, yet at a lower cost. Learn more»

 

AN/GSM-397(V) Electronic System Test Set (ESTS)

ESTS is a technically advanced, open architecture test system built to provide intermediate test capability for the USAF F-15.

AN/TSM-191(V)5 Electronics Shop, Transportable (EOTF)

Northrop Grumman’s AN/TSM-191(V)5 Electronics Shop, Transportable, commonly known as the Electro-Optics Test Facility (EOTF), tests an extensive range of Army electro-optics (EO) systems.

AN/USM-632(V)3 Base Shop Test Facility (BSTF)

BSTF is a compact, modular, high performance automatic test set that is easily tailored to a full range of applications.

AN/USM-632(V)4 Electro-Optic Test Station (EOTS)

EOTS tests an extensive range of Army electro-optic systems. EOTS is part of IFTE, and tests and fault isolates electro-optical and electronic LRUs in a full range of weapon systems.

Agile Rapid Global Combat Support (ARGCS)

ARGCS Fully integrates diagnostics, directed test, net-centric capabilities, yet at a lower cost.

Base Shop Test Facility (V)6

BSTF is a compact, modular, high performance automatic test set that is easily tailored to a full range of applications.

Combined Intermediate-Level ATE (CIATE)

Northrop Grumman's Combined Intermediate-Level Automatic Test Equipment (CIATE) provides a comprehensive line replaceable unit (LRU) and shop replaceable unit (SRU) test capability for factory, depot and intermediate-level support.

Commercial Equivalent Equipment (CEE)

All TPSs developed on the CEE are fully transportable to the militarized, field-deployable BSTF.

Electro-Optical Module (EOM)

The EOM electro-optical test device provides highly automated, accurate, reliable and repeatable test results.

Electro-Optical Subsystem (EOSS+)

EOSS+ is a consolidated, integrated EO automatic test system.

Integrated Family of Test Equipment (IFTE)

IFTE is a series of test systems used off-system for testing electronic and electro-optic weapons devices, including missile systems, vehicles, aircraft and more.

Virtual System Analyzer (VSA)

The VSA performs precision RF/microwave testing of complex EW systems in a small footprint – one "C" size, 13 slot, standard VXI cage.